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Study of the factors that affect the correlation behavior during the evaluation of interferograms

  • Universidad Autónoma de México (UNAM)
Research Output:
Contribution to journal
Article
Peer-review

Open access

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SciVal
FWCI
0.12
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Author count
3
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Citations
2
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Paper percentile
31
Scopus
Citations

Abstract

In recent years, the correlation coefficient has been used as a tool for comparison between experimental and synthetic interferograms in algorithms of evaluation, in the areas of optical fabrication and testing. This coefficient has been used with the aim of eliminating the observer criterion during the fabrication process, and in this sense, to make a quantitative test to compare experimental and synthetic interferograms using the correlation as a parameter of evaluation. However, this coefficient is dramatically affected when laboratory conditions are not adequate. Therefore, in this work, we present a detailed analysis of the correlation behavior when interferograms with different values of visibility, Gaussian noise, and background illumination are evaluated/correlated. To analyze the correlation behavior, we simulated different interferograms, where these parameters were varied and examined how they affect the interference patterns. We found that a bad illumination dramatically affects the value of correlation, causing it to decrease to 0.1046, with σ = 0.1.

Publication Information

Output type

Research Output:
Contribution to journal
Article
Peer-review

Original language

English

Article number

104111

Pages from-to (Number of pages)

Pages 1

Journal (Volume, Issue Number)

SPIE J (Volume 57, Issue 10)

Publication milestones

  • Published - 01/10/2018

Publication status

Published - 01/10/2018

ISSN

0091-3286

Publication IDs

  • ORCID: /0000-0002-3310-5197/work/60121017
  • Scopus: 85055846211
  • WOS: 000449340000033

Funding Details

We are grateful for the financial support for this project from the Dirección General de Asuntos del Personal Académico (DGAPA)‐UNAM, through the grant PAPIIT No: TA100217 “Sistema de medición de objetos reflectores uti-lizados en la industria automotriz basado en la prueba de pantallas nulas y algoritmos probabilistas.” B.V.-M. would thank the CONACyT for the postdoctoral scholarship granted.
FundersFunding numbers
CONACYT
-
DGAPA, UNAM
TA100217