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Interferometric measurement of local radii of curvature for aspheric surface using a PDI

  • Universidad Autónoma de México (UNAM)
    ,
  • Instituto Nacional de Astrofisica Optica y Electronica
Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution

Publication metrics

Metrics

SciVal
Author count
5
SciVal
Paper percentile
25

Abstract

One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.

Publication Information

Output type

Research Output:
Chapter in Book/Report/Conference proceeding
Conference contribution

Original language

English

Article number

110561O

Pages from-to (Number of pages)

Pages 56

Publication milestones

  • Published - 21/06/2019

Publication status

Published - 21/06/2019

Volume

11056

Publication series

  • Publication series name: Proceedings of SPIE - The International Society for Optical Engineering
    ISSN (Print): 0277-786X
    ISSN (Electronic): 1996-756X
    Volume: 11056
9781510627918, 9781510627925, 9781510627918, 9781510627925, 9781510627918, 9781510627925

ISBN (Electronic)

9781510627918

Publication IDs

  • ORCID: /0000-0002-3310-5197/work/60120932
  • Scopus: 85076675345

Host publication title

Optical Measurement Systems for Industrial Inspection XI

Host publication editors

  • Peter Lehmann
  • Wolfgang Osten
  • Armando Albertazzi Goncalves