Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies
- Celso Cruz,
- Pedro Gonzalez-Garcia,
- ,
- Saul Santillán,
- Rodrigo Romero
- Dynamical System Department, Centro de Ingeniería y Desarrollo Industrial,
- ,
- Metalsa,
- Universidad Nacional Autónoma de México
Research Output: Chapter in Book/Report/Conference proceeding Chapter (peer-reviewed) Peer-review
Open access
Abstract
Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education
Publication Information
Output type
Research Output: Chapter in Book/Report/Conference proceeding Chapter (peer-reviewed) Peer-review
Original language
EnglishPages from-to (Number of pages)
Pages 464 - 473 (10 pages)Publication milestones
- Published - 02/2017
Publication status
Published - 02/2017
Place of publication
SpainEdition
1Publisher
Formatex Research Center ISBN (Print)
978-84-942134-9-6Chapter Number
66Host publication title
Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and educationAccess to documents
Final published version
License:Unspecified