Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz, Jaime Taha-Tijerina, Pedro Gonzalez-Garcia, Saul Santillán, Rodrigo Romero

Producción científica

Huella

Profundice en los temas de investigación de 'Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies'. En conjunto forman una huella única.

Pharmacology, Toxicology and Pharmaceutical Science

Physics

Engineering

Biochemistry, Genetics and Molecular Biology

Material Science