Measurement of a highly freeform surface using a cylindrical null-screen

Oliver Huerta-Carranza, Manuel Campos-Garciá, Daniel Aguirre-Aguirre, Brenda Villalobos Mendoza, Victor Ivan Moreno-Oliva

Producción científica

2 Citas (Scopus)

Resumen

We propose a method to design the null-screen on a cylindrical surface when the surface under test is a freeform, this implies that the surface is described by a complex analytical expression. Also, the method avoids overlapping objects in the image plane this assures the appropriate correlation between the object and the image points. The surface under study was designed using Zernike polynomials and it was built through a 3D printer and CNC machine. To retrieve the surface sagitta, in previous work, we obtained the best-fitting surface using a probabilistic algorithm. In this work, we propose to measure the slopes of the test surface in the x and y directions, and by integration, we calculated the sagitta of the test surface. We present a comparison between both methods to show which of them recovers the shape of the surface more accurately.
Idioma originalEnglish
Título de la publicación alojadaOptical Fabrication, Testing, and Metrology VII
EditoresRoland Geyl, Deitze Otaduy, Reinhard Volkel
EditorialSPIE
Páginas12
ISBN (versión digital)9781510645905
ISBN (versión impresa)9781510645905
DOI
EstadoPublished - 2021
EventoOptical Fabrication, Testing, and Metrology VII 2021 - Virtual, Online
Duración: 13 sept 202117 sept 2021

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen11873
ISSN (versión impresa)0277-786X
ISSN (versión digital)1996-756X

Conference

ConferenceOptical Fabrication, Testing, and Metrology VII 2021
País/TerritorioSpain
CiudadVirtual, Online
Período13/9/2117/9/21

Nota bibliográfica

Publisher Copyright:
© 2021 SPIE.

All Science Journal Classification (ASJC) codes

  • Materiales electrónicos, ópticos y magnéticos
  • Física de la materia condensada
  • Informática aplicada
  • Matemáticas aplicadas
  • Ingeniería eléctrica y electrónica

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