Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography

Daniel Hiller, Sebastian Gutsch, Julian López-Vidrier, Margit Zacharias, Sònia Estradé, Francesca Peiró, Irving Cruz-Matías, Dolors Ayala

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2 Citas (Scopus)


The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO 2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.

Idioma originalEnglish
Número de artículo1700216
PublicaciónPhysica Status Solidi (C) Current Topics in Solid State Physics
EstadoPublished - 1 dic 2017

All Science Journal Classification (ASJC) codes

  • Física de la materia condensada


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