TY - JOUR
T1 - Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography
AU - Hiller, Daniel
AU - Gutsch, Sebastian
AU - López-Vidrier, Julian
AU - Zacharias, Margit
AU - Estradé, Sònia
AU - Peiró, Francesca
AU - Cruz-Matías, Irving
AU - Ayala, Dolors
N1 - Funding Information:
We gratefully acknowledge Lena F. Kourkoutis (Cornell University) for EFTEM-tomography. This work was partially supported by the national Projects TIN2008-02903 and TIN2011-24220 of the Spanish government. We also acknowledge the financial support from the Spanish Ministry of Economy, Industry and Competitiveness through the project MAT2016-79455-P, with support of FEDER funds.
Publisher Copyright:
© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/12/1
Y1 - 2017/12/1
N2 - The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO
2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.
AB - The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO
2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.
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UR - https://www.mendeley.com/catalogue/d70dd7af-8628-366c-97a2-fa2c16dd64e7/
U2 - 10.1002/pssc.201700216
DO - 10.1002/pssc.201700216
M3 - Article
SN - 1862-6351
VL - 14
JO - Physica Status Solidi (C) Current Topics in Solid State Physics
JF - Physica Status Solidi (C) Current Topics in Solid State Physics
IS - 12
M1 - 1700216
ER -