Characterization of MoO3 thin films deposited by laser ablation

Enrique Campos-Gonzalez; Enrique Camps; Michael Morales-Luna; Carlos Rivera-Rodriguez; Rafael Basurto

doi:10.1016/j.matlet.2020.128355

Characterization of MoO3 thin films deposited by laser ablation

Enrique Campos-Gonzalez, Enrique Camps, Michael Morales-Luna, Carlos Rivera-Rodriguez, Rafael Basurto

Departamento de Diseño Industrial

Resultado de la investigación › revisión exhaustiva

Resumen

Molybdenum oxide thin films were deposited using the laser ablation technique, at three values of working pressure and four values of the mean kinetic energy (E _k) of the plasma ions. The structural characterization of the films performed by X-ray diffraction and Raman spectroscopies showed the presence of the α–MoO ₃ phase in all cases. On the other hand, the value of the band-gap varied from 2.8 to 3.3 eV, depending on the experimental conditions. The XPS analysis showed a variation of the stoichiometry from MoO _2.5 to MoO _3.4 which could explain the variation of the band-gap.

Idioma original	English
Número de artículo	128355
Páginas (desde-hasta)	1-3
Número de páginas	3
Publicación	Materials Letters
Volumen	277
N.º	128355
DOI	https://doi.org/10.1016/j.matlet.2020.128355
Estado	Published - 15 oct 2020

All Science Journal Classification (ASJC) codes

Materials Science(all)

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title = "Characterization of MoO3 thin films deposited by laser ablation",

abstract = "Molybdenum oxide thin films were deposited using the laser ablation technique, at three values of working pressure and four values of the mean kinetic energy (E k) of the plasma ions. The structural characterization of the films performed by X-ray diffraction and Raman spectroscopies showed the presence of the α–MoO 3 phase in all cases. On the other hand, the value of the band-gap varied from 2.8 to 3.3 eV, depending on the experimental conditions. The XPS analysis showed a variation of the stoichiometry from MoO 2.5 to MoO 3.4 which could explain the variation of the band-gap. ",

author = "Enrique Campos-Gonzalez and Enrique Camps and Michael Morales-Luna and Carlos Rivera-Rodriguez and Rafael Basurto",

note = "Funding Information: This work was partially supported by CONACYT under contract No. 252972. Enrique Campos thank C?tedras CONACYT and M.M.-L. wants to thanks for Universidad de Monterrey, M?xico support. Funding Information: This work was partially supported by CONACYT under contract No. 252972. Enrique Campos thank C{\'a}tedras CONACYT and M.M.-L. wants to thanks for Universidad de Monterrey, M{\'e}xico support. Publisher Copyright: {\textcopyright} 2020 Elsevier B.V. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.",

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doi = "10.1016/j.matlet.2020.128355",

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AU - Campos-Gonzalez, Enrique

AU - Camps, Enrique

AU - Morales-Luna, Michael

AU - Rivera-Rodriguez, Carlos

AU - Basurto, Rafael

N1 - Funding Information: This work was partially supported by CONACYT under contract No. 252972. Enrique Campos thank C?tedras CONACYT and M.M.-L. wants to thanks for Universidad de Monterrey, M?xico support. Funding Information: This work was partially supported by CONACYT under contract No. 252972. Enrique Campos thank Cátedras CONACYT and M.M.-L. wants to thanks for Universidad de Monterrey, México support. Publisher Copyright: © 2020 Elsevier B.V. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.

PY - 2020/10/15

Y1 - 2020/10/15

N2 - Molybdenum oxide thin films were deposited using the laser ablation technique, at three values of working pressure and four values of the mean kinetic energy (E k) of the plasma ions. The structural characterization of the films performed by X-ray diffraction and Raman spectroscopies showed the presence of the α–MoO 3 phase in all cases. On the other hand, the value of the band-gap varied from 2.8 to 3.3 eV, depending on the experimental conditions. The XPS analysis showed a variation of the stoichiometry from MoO 2.5 to MoO 3.4 which could explain the variation of the band-gap.

AB - Molybdenum oxide thin films were deposited using the laser ablation technique, at three values of working pressure and four values of the mean kinetic energy (E k) of the plasma ions. The structural characterization of the films performed by X-ray diffraction and Raman spectroscopies showed the presence of the α–MoO 3 phase in all cases. On the other hand, the value of the band-gap varied from 2.8 to 3.3 eV, depending on the experimental conditions. The XPS analysis showed a variation of the stoichiometry from MoO 2.5 to MoO 3.4 which could explain the variation of the band-gap.

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