Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz, Jaime Taha-Tijerina, Pedro Gonzalez-Garcia, Saul Santillán, Rodrigo Romero

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The use of scanning electron microscopy, atomic force microscopy, and optical profilometry is described as analyses techniques to obtaining information (topography, inter-valley distance and semi-quantitative chemical content) from the adherent surface on metals and carbon fibre composites. Surface inspection and post fracture analyses were performed on aluminium and carbon fibre, as adherends, to demonstrate that exist a strong relationship between the initial surface treatment, wettability and post fracture on the basis that the surface morphology is one of the most important factors to take into consideration when adhesive joining is performed. The microscopy observations permit to understand the crack growth in the adhesive bonding and show how it depends of the surface finishing quality and presence of surface
contaminants. Therefore, use of microscopy techniques are vital to predict if the failure mode will be cohesive, adhesive or a combination of both, and also their influence to correct the surface preparation procedure, thus improve adherence.
Original languageEnglish
Title of host publicationMicroscopy and imaging science: practical approaches to applied research and education
EditorsA. Méndez-Vilas
Place of PublicationSpain
Pages464 - 473
Number of pages10
Edition1
Publication statusPublished - Feb 2017

    Fingerprint

Cite this

Cruz, C., Taha-Tijerina, J., Gonzalez-Garcia, P., Santillán, S., & Romero, R. (2017). Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In A. Méndez-Vilas (Ed.), Microscopy and imaging science: practical approaches to applied research and education (1 ed., pp. 464 - 473). Spain.