Abstract
We propose a method to design the null-screen on a cylindrical surface when the surface under test is a freeform, this implies that the surface is described by a complex analytical expression. Also, the method avoids overlapping objects in the image plane this assures the appropriate correlation between the object and the image points. The surface under study was designed using Zernike polynomials and it was built through a 3D printer and CNC machine. To retrieve the surface sagitta, in previous work, we obtained the best-fitting surface using a probabilistic algorithm. In this work, we propose to measure the slopes of the test surface in the x and y directions, and by integration, we calculated the sagitta of the test surface. We present a comparison between both methods to show which of them recovers the shape of the surface more accurately.
Original language | English |
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Title of host publication | Optical Fabrication, Testing, and Metrology VII |
Editors | Roland Geyl, Deitze Otaduy, Reinhard Volkel |
Publisher | SPIE |
Pages | 12 |
ISBN (Electronic) | 9781510645905 |
ISBN (Print) | 9781510645905 |
DOIs | |
Publication status | Published - 2021 |
Event | Optical Fabrication, Testing, and Metrology VII 2021 - Virtual, Online, Spain Duration: 13 Sept 2021 → 17 Sept 2021 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 11873 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Optical Fabrication, Testing, and Metrology VII 2021 |
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Country/Territory | Spain |
City | Virtual, Online |
Period | 13/9/21 → 17/9/21 |
Bibliographical note
Funding Information:This research was supported by the Dirección General de Asuntos del Personal Académico, Universidad Nacional Autónoma de México (DGAPA-UNAM) under the projects Programa de Apoyo a Proyectos de Investigación e Inovación Tecnológica (PAPIIT) No: IT100321 and TA100521.
Publisher Copyright:
© 2021 SPIE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering