Measurement of a highly freeform surface using a cylindrical null-screen

Oliver Huerta-Carranza, Manuel Campos-Garciá, Daniel Aguirre-Aguirre, Brenda Villalobos Mendoza, Victor Ivan Moreno-Oliva

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


We propose a method to design the null-screen on a cylindrical surface when the surface under test is a freeform, this implies that the surface is described by a complex analytical expression. Also, the method avoids overlapping objects in the image plane this assures the appropriate correlation between the object and the image points. The surface under study was designed using Zernike polynomials and it was built through a 3D printer and CNC machine. To retrieve the surface sagitta, in previous work, we obtained the best-fitting surface using a probabilistic algorithm. In this work, we propose to measure the slopes of the test surface in the x and y directions, and by integration, we calculated the sagitta of the test surface. We present a comparison between both methods to show which of them recovers the shape of the surface more accurately.

Original languageEnglish
Title of host publicationOptical Fabrication, Testing, and Metrology VII
EditorsRoland Geyl, Deitze Otaduy, Reinhard Volkel
ISBN (Electronic)9781510645905
ISBN (Print)9781510645905
Publication statusPublished - 2021
EventOptical Fabrication, Testing, and Metrology VII 2021 - Virtual, Online, Spain
Duration: 13 Sept 202117 Sept 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceOptical Fabrication, Testing, and Metrology VII 2021
CityVirtual, Online

Bibliographical note

Funding Information:
This research was supported by the Dirección General de Asuntos del Personal Académico, Universidad Nacional Autónoma de México (DGAPA-UNAM) under the projects Programa de Apoyo a Proyectos de Investigación e Inovación Tecnológica (PAPIIT) No: IT100321 and TA100521.

Publisher Copyright:
© 2021 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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