Ion Trapping and Detrapping in Amorphous Tungsten Oxide Thin Films Observed by Real-Time Electro-Optical Monitoring

Rui Tao Wen*, Miguel A. Arvizu, Michael Morales-Luna, Claes G. Granqvist, Gunnar A. Niklasson

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

65 Citations (Scopus)

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