Interferometric measurement of local radii of curvature for aspheric surface using a PDI

Daniel Aguirre-Aguirre, Brenda Villalobos Mendoza, M.E. Percino-Zacarías, F.S. Granados-Agustín, A. Cornejo-Rodríguez

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.
Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
Volume11056
DOIs
Publication statusPublished - 21 Jun 2019
Externally publishedYes

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interferometers
curvature
radii
diffraction
proposals
symmetry
versatility
light sources
slopes
interference
sensitivity
sensors

Cite this

Aguirre-Aguirre, D., Villalobos Mendoza, B., Percino-Zacarías, M. E., Granados-Agustín, F. S., & Cornejo-Rodríguez, A. (2019). Interferometric measurement of local radii of curvature for aspheric surface using a PDI. In Optical Measurement Systems for Industrial Inspection XI (Vol. 11056) https://doi.org/10.1117/12.2527556
Aguirre-Aguirre, Daniel ; Villalobos Mendoza, Brenda ; Percino-Zacarías, M.E. ; Granados-Agustín, F.S. ; Cornejo-Rodríguez, A. / Interferometric measurement of local radii of curvature for aspheric surface using a PDI. Optical Measurement Systems for Industrial Inspection XI. Vol. 11056 2019.
@inproceedings{06ea54fb7cce4a948bb0c1aa7bd5ffd6,
title = "Interferometric measurement of local radii of curvature for aspheric surface using a PDI",
abstract = "One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.",
author = "Daniel Aguirre-Aguirre and {Villalobos Mendoza}, Brenda and M.E. Percino-Zacar{\'i}as and F.S. Granados-Agust{\'i}n and A. Cornejo-Rodr{\'i}guez",
year = "2019",
month = "6",
day = "21",
doi = "10.1117/12.2527556",
language = "English",
isbn = "9781510627918",
volume = "11056",
booktitle = "Optical Measurement Systems for Industrial Inspection XI",

}

Aguirre-Aguirre, D, Villalobos Mendoza, B, Percino-Zacarías, ME, Granados-Agustín, FS & Cornejo-Rodríguez, A 2019, Interferometric measurement of local radii of curvature for aspheric surface using a PDI. in Optical Measurement Systems for Industrial Inspection XI. vol. 11056. https://doi.org/10.1117/12.2527556

Interferometric measurement of local radii of curvature for aspheric surface using a PDI. / Aguirre-Aguirre, Daniel ; Villalobos Mendoza, Brenda; Percino-Zacarías, M.E.; Granados-Agustín, F.S.; Cornejo-Rodríguez, A.

Optical Measurement Systems for Industrial Inspection XI. Vol. 11056 2019.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Interferometric measurement of local radii of curvature for aspheric surface using a PDI

AU - Aguirre-Aguirre, Daniel

AU - Villalobos Mendoza, Brenda

AU - Percino-Zacarías, M.E.

AU - Granados-Agustín, F.S.

AU - Cornejo-Rodríguez, A.

PY - 2019/6/21

Y1 - 2019/6/21

N2 - One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.

AB - One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.

UR - http://dx.doi.org/10.1117/12.2527556

U2 - 10.1117/12.2527556

DO - 10.1117/12.2527556

M3 - Conference contribution

SN - 9781510627918

SN - 9781510627925

SN - 9781510627918

SN - 9781510627925

SN - 9781510627918

SN - 9781510627925

VL - 11056

BT - Optical Measurement Systems for Industrial Inspection XI

ER -

Aguirre-Aguirre D, Villalobos Mendoza B, Percino-Zacarías ME, Granados-Agustín FS, Cornejo-Rodríguez A. Interferometric measurement of local radii of curvature for aspheric surface using a PDI. In Optical Measurement Systems for Industrial Inspection XI. Vol. 11056. 2019 https://doi.org/10.1117/12.2527556