Interferometric measurement of local radii of curvature for aspheric surface using a PDI

Daniel Aguirre-Aguirre, Brenda Villalobos Mendoza, M.E. Percino-Zacarías, F.S. Granados-Agustín, A. Cornejo-Rodríguez

Research output: Chapter in Book/Report/Conference proceedingConference contribution


One of the problems that have manufacturers of aspheric and freeform surfaces is the local measurement of the shape, in order to ensure the performance of the surface. In this paper we present an alternative method to measure local radii of curvature of systems with symmetry revolution, using the Point Diffraction Interferometer technique (PDI). To implement this proposal a certified plane wavefront is used as reference light source, and the PDI as sensor element for measuring the local radii of curvature. We proposed to use a PDI due to its high sensitivity because is a common path interferometer and generate interference only when there is an only point a single convergence which is produced from an annular region of the surface, and the annular region is associated to each local curvature center. Experimental results are shown for one aspherical surface with different rates of change in their slopes for each region of the surface, showing the versatility of the proposal and its possible use, including free-form surfaces without symmetry of revolution.
Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Goncalves
ISBN (Electronic)9781510627918
Publication statusPublished - 21 Jun 2019
Externally publishedYes

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Bibliographical note

Publisher Copyright:
© SPIE. Downloading of the abstract is permitted for personal use only.

Copyright 2019 Elsevier B.V., All rights reserved.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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