Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography

Daniel Hiller, Sebastian Gutsch, Julian López-Vidrier, Margit Zacharias, Sònia Estradé, Francesca Peiró, Irving Cruz-Matías, Dolors Ayala

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.
Original languageEnglish
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
DOIs
Publication statusPublished - 1 Dec 2017

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tomography
quantum dots
transmission electron microscopy
silicon
superlattices
energy
nanocrystals
fabrication
defects
simulation

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

Hiller, Daniel ; Gutsch, Sebastian ; López-Vidrier, Julian ; Zacharias, Margit ; Estradé, Sònia ; Peiró, Francesca ; Cruz-Matías, Irving ; Ayala, Dolors. / Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography. In: Physica Status Solidi (C) Current Topics in Solid State Physics. 2017.
@article{15a7472e37e147e3a40f31f795723173,
title = "Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography",
abstract = "{\circledC} 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.",
author = "Daniel Hiller and Sebastian Gutsch and Julian L{\'o}pez-Vidrier and Margit Zacharias and S{\`o}nia Estrad{\'e} and Francesca Peir{\'o} and Irving Cruz-Mat{\'i}as and Dolors Ayala",
year = "2017",
month = "12",
day = "1",
doi = "10.1002/pssc.201700216",
language = "English",
journal = "Physica Status Solidi (C) Current Topics in Solid State Physics",
issn = "1862-6351",
publisher = "Wiley-VCH Verlag",

}

Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography. / Hiller, Daniel; Gutsch, Sebastian; López-Vidrier, Julian; Zacharias, Margit; Estradé, Sònia; Peiró, Francesca; Cruz-Matías, Irving; Ayala, Dolors.

In: Physica Status Solidi (C) Current Topics in Solid State Physics, 01.12.2017.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography

AU - Hiller, Daniel

AU - Gutsch, Sebastian

AU - López-Vidrier, Julian

AU - Zacharias, Margit

AU - Estradé, Sònia

AU - Peiró, Francesca

AU - Cruz-Matías, Irving

AU - Ayala, Dolors

PY - 2017/12/1

Y1 - 2017/12/1

N2 - © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.

AB - © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.

U2 - 10.1002/pssc.201700216

DO - 10.1002/pssc.201700216

M3 - Article

JO - Physica Status Solidi (C) Current Topics in Solid State Physics

JF - Physica Status Solidi (C) Current Topics in Solid State Physics

SN - 1862-6351

ER -