Determination of Shape and Sphericity of Silicon Quantum Dots Imaged by EFTEM-Tomography

Daniel Hiller, Sebastian Gutsch, Julian López-Vidrier, Margit Zacharias, Sònia Estradé, Francesca Peiró, Irving Cruz-Matías, Dolors Ayala

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2 Citations (Scopus)


The shape of size-controlled silicon nanocrystals (Si NCs) embedded in SiO 2 is investigated by tomographic energy-filtered transmission electron microscopy (EFTEM). The sphericity of the quantum dots is determined by computational analyses. In contrast to other fabrication methods, we demonstrate that the NCs in superlattices are non-agglomerated, individual clusters with slightly oblate spheroidal shape. This allows for low surface-to-volume ratios and thereby low non-radiative defect densities as required by optoelectronic or sensing applications. A near-spherical shape is also a prerequisite for the direct comparison of Si quantum dots (QDs) with theoretical simulations.

Original languageEnglish
Article number1700216
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Issue number12
Publication statusPublished - 1 Dec 2017

Bibliographical note

Funding Information:
We gratefully acknowledge Lena F. Kourkoutis (Cornell University) for EFTEM-tomography. This work was partially supported by the national Projects TIN2008-02903 and TIN2011-24220 of the Spanish government. We also acknowledge the financial support from the Spanish Ministry of Economy, Industry and Competitiveness through the project MAT2016-79455-P, with support of FEDER funds.

Publisher Copyright:
© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Copyright 2017 Elsevier B.V., All rights reserved.

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics


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