Molybdenum oxide thin films were deposited using the laser ablation technique, at three values of working pressure and four values of the mean kinetic energy (E k) of the plasma ions. The structural characterization of the films performed by X-ray diffraction and Raman spectroscopies showed the presence of the α–MoO 3 phase in all cases. On the other hand, the value of the band-gap varied from 2.8 to 3.3 eV, depending on the experimental conditions. The XPS analysis showed a variation of the stoichiometry from MoO 2.5 to MoO 3.4 which could explain the variation of the band-gap.
Bibliographical noteFunding Information:
This work was partially supported by CONACYT under contract No. 252972. Enrique Campos thank Cátedras CONACYT and M.M.-L. wants to thanks for Universidad de Monterrey, México support.
© 2020 Elsevier B.V.
All Science Journal Classification (ASJC) codes
- Materials Science(all)