TY - CHAP
T1 - Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies
AU - Cruz, Celso
AU - Gonzalez-Garcia, Pedro
AU - Taha-Tijerina, Jaime
AU - Santillán, Saul
AU - Romero, Rodrigo
N1 - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education" pp 464 – 473
PY - 2017/2
Y1 - 2017/2
N2 - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education
AB - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education
M3 - Chapter (peer-reviewed)
SN - 978-84-942134-9-6
SP - 464
EP - 473
BT - Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education
PB - Formatex Research Center
CY - Spain
ER -