Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz, Pedro Gonzalez-Garcia, Jaime Taha-Tijerina, Saul Santillán, Rodrigo Romero

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Abstract

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education
Original languageEnglish
Title of host publicationMicroscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education
Place of PublicationSpain
PublisherFormatex Research Center
Chapter66
Pages464 - 473
Number of pages10
Edition1
ISBN (Print)978-84-942134-9-6
Publication statusPublished - Feb 2017

Bibliographical note

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education" pp 464 – 473

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  • Cite this

    Cruz, C., Gonzalez-Garcia, P., Taha-Tijerina, J., Santillán, S., & Romero, R. (2017). Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education (1 ed., pp. 464 - 473). Formatex Research Center . http://www.microscopy7.org/book/464-473.pdf