Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz, Pedro Gonzalez-Garcia, Jaime Taha-Tijerina, Saul Santillán, Rodrigo Romero

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Abstract

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education
Original languageEnglish
Title of host publicationMicroscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education
Place of PublicationSpain
PublisherFormatex Research Center
Chapter66
Pages464 - 473
Number of pages10
Edition1
ISBN (Print)978-84-942134-9-6
Publication statusPublished - Feb 2017

Fingerprint

Profilometry
Atomic force microscopy
Adhesives
Microscopic examination
Scanning electron microscopy
Education
Imaging techniques

Bibliographical note

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education" pp 464 – 473

Cite this

Cruz, C., Gonzalez-Garcia, P., Taha-Tijerina, J., Santillán, S., & Romero, R. (2017). Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education (1 ed., pp. 464 - 473). Spain: Formatex Research Center .
Cruz, Celso ; Gonzalez-Garcia, Pedro ; Taha-Tijerina, Jaime ; Santillán, Saul ; Romero, Rodrigo . / Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1. ed. Spain : Formatex Research Center , 2017. pp. 464 - 473
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author = "Celso Cruz and Pedro Gonzalez-Garcia and Jaime Taha-Tijerina and Saul Santill{\'a}n and Rodrigo Romero",
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Cruz, C, Gonzalez-Garcia, P, Taha-Tijerina, J, Santillán, S & Romero, R 2017, Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. in Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1 edn, Formatex Research Center , Spain, pp. 464 - 473.

Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. / Cruz, Celso; Gonzalez-Garcia, Pedro; Taha-Tijerina, Jaime; Santillán, Saul; Romero, Rodrigo .

Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1. ed. Spain : Formatex Research Center , 2017. p. 464 - 473.

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

TY - CHAP

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AU - Santillán, Saul

AU - Romero, Rodrigo

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PY - 2017/2

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AB - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education

M3 - Chapter (peer-reviewed)

SN - 978-84-942134-9-6

SP - 464

EP - 473

BT - Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education

PB - Formatex Research Center

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Cruz C, Gonzalez-Garcia P, Taha-Tijerina J, Santillán S, Romero R. Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1 ed. Spain: Formatex Research Center . 2017. p. 464 - 473