Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz; Pedro Gonzalez-Garcia; Jaime Taha-Tijerina; Saul Santillán; Rodrigo  Romero

Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Celso Cruz, Pedro Gonzalez-Garcia, Jaime Taha-Tijerina, Saul Santillán, Rodrigo Romero

Departamento de Ingeniería Mecánica y Eléctrica

Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review

Abstract

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education

Original language	English
Title of host publication	Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education
Place of Publication	Spain
Publisher	Formatex Research Center
Chapter	66
Pages	464 - 473
Number of pages	10
Edition	1
ISBN (Print)	978-84-942134-9-6
Publication status	Published - Feb 2017

Bibliographical note

Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education" pp 464 – 473

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Cite this

Cruz, C., Gonzalez-Garcia, P., Taha-Tijerina, J., Santillán, S., & Romero, R. (2017). Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education (1 ed., pp. 464 - 473). Formatex Research Center . http://www.microscopy7.org/book/464-473.pdf

Cruz, Celso ; Gonzalez-Garcia, Pedro ; Taha-Tijerina, Jaime et al. / Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1. ed. Spain : Formatex Research Center , 2017. pp. 464 - 473

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abstract = "Celso Cruz, Pedro Gonz{\'a}lez Garc{\'i}a, Saul Santill{\'a}n Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies{"}, in Microscopy Science Book Series {"}Microscopy and imaging science: practical approaches to applied research and education",

author = "Celso Cruz and Pedro Gonzalez-Garcia and Jaime Taha-Tijerina and Saul Santill{\'a}n and Rodrigo Romero",

note = "Celso Cruz, Pedro Gonz{\'a}lez Garc{\'i}a, Saul Santill{\'a}n Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies{"}, in Microscopy Science Book Series {"}Microscopy and imaging science: practical approaches to applied research and education{"} pp 464 – 473 ",

year = "2017",

month = feb,

language = "English",

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Cruz, C, Gonzalez-Garcia, P, Taha-Tijerina, J, Santillán, S & Romero, R 2017, Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. in Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1 edn, Formatex Research Center , Spain, pp. 464 - 473. <http://www.microscopy7.org/book/464-473.pdf>

Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. / Cruz, Celso; Gonzalez-Garcia, Pedro; Taha-Tijerina, Jaime et al.
Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1. ed. Spain: Formatex Research Center , 2017. p. 464 - 473.

Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review

TY - CHAP

T1 - Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

AU - Cruz, Celso

AU - Gonzalez-Garcia, Pedro

AU - Taha-Tijerina, Jaime

AU - Santillán, Saul

AU - Romero, Rodrigo

N1 - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education" pp 464 – 473

PY - 2017/2

Y1 - 2017/2

N2 - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education

AB - Celso Cruz, Pedro González García, Saul Santillán Gutierrez, Jaime Taha-Tijerina, Rodrigo Romero Llerenas (2017) “Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies", in Microscopy Science Book Series "Microscopy and imaging science: practical approaches to applied research and education

M3 - Chapter (peer-reviewed)

SN - 978-84-942134-9-6

SP - 464

EP - 473

BT - Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education

PB - Formatex Research Center

CY - Spain

ER -

Cruz C, Gonzalez-Garcia P, Taha-Tijerina J, Santillán S, Romero R. Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies. In Microscopy Science Book Series - Microscopy and imaging science: practical approaches to applied research and education. 1 ed. Spain: Formatex Research Center . 2017. p. 464 - 473

Chapter 66: Scanning electron microscopy, atomic force microscopy and optical profilometry applied to adhesive bonding technologies

Abstract

Bibliographical note

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