A simple device for sub-aperture stitching of fast convex surfaces

D. Aguirre-Aguirre, R. Izazaga-Pérez, B. Villalobos-Mendoza, E. Carrasco-Licea, F.S. Granados-Agustin, M.E. Percino-Zacariás, M.F. Salazar-Morales, E. Cruz-Zavala

Research output: Chapter in Book/Report/Conference proceedingConference contribution


In this work, we show a simple device that helps in the use of the sub-aperture stitching method for testing convex surfaces with large diameter and a small f/#. This device was designed at INAOE's Optical work shop to solve the problem that exists when a Newton Interferometer and the sub-aperture stitching method are used. It is well known that if the f/# of a surface is small, the slopes over the surface increases rapidly and this is critical for points far from the vertex. Therefore, if we use a reference master in the Newton interferometer to test a convex surface with a large diameter and an area far from the vertex, the master tends to slide causing scratches over the surface under test. To solve this problem, a device for mounting the surface under test with two freedom degrees, a rotating axis and a lever to tilt the surface, was designed. As result, the optical axis of the master can be placed in vertical position avoiding undesired movements of the master and making the sub-aperture stitching easier. We describe the proposed design and the results obtained with this device.

Original languageEnglish
Title of host publicationOptifab 2015
EditorsSebastian Stoebenau, Julie L. Bentley
ISBN (Electronic)9781628418385
Publication statusPublished - 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Bibliographical note

Publisher Copyright:
© 2015 SPIE.

Copyright 2016 Elsevier B.V., All rights reserved.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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