Scanning Electron Microscope Tescan Vega 3

    Facility/equipment: Equipment

      Equipments Details

      Description

      Scanning electron microscopy is a well-known non-destructive technique that uses an electron beam probe to analyse samples surface down to nano-scale. The scanning electron microscopes produce high magnification images with high resolution, a feature of which makes them suitable tools for a wide range of applications in numerous fields of science and industry.

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